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Beilstein J. Nanotechnol. 2018, 9, 224–232, doi:10.3762/bjnano.9.24
Figure 1: Scanning electron micrographs of deposits from AgO2CC2F5 on bulk 200 nm SiO2/Si using a 25 keV/0.25...
Figure 2: SEM images of box deposits with the same electron dose of 7.44 nC/µm2 but different dwell and refre...
Figure 3: Images of a line deposit on a carbon membrane. (a) Scanning electron micrograph of the line deposit...
Figure 4: Dark field scanning transmission electron micrographs of the line deposit. (a) Overview image of th...
Figure 5: LineTV: FEBID line connecting four gold electrodes for four point probe measurements on bulk SiO2/S...
Figure 6: Transmission electron micrographs of the carbon membrane after deposition. (a) Typical dark field S...